Title: Single-shot carrier-envelope-phase tagged ion-momentum imaging of non-sequential double ionization of argon in intense 4-fs laser fields

Nora G. Johnson[1,2], O. Herrwerth[1], A. Wirth[1], S. De[2], I. Ben-Itzhak[2], M. Lezius[1], B. Bergues [1], M.F. Kling [1,2], A. Senftleben[3], C.D. Schröter[3], R. Moshammer[3], J. Ullrich[3], K.J. Betsch[4], R.R. Jones[4], A.M. Sayler[5,6], T. Rathje[5,6], Klaus Rühle[5,6], Walter Müller[5,6], G.G. Paulus[5,6,7]

[1] Max-Planck-Institut für Quantenoptik, Garching 85748, Germany

[2] Kansas State University, Manhattan, KS 66506, USA

[3] Max-Planck-Institut für Kernphysik, Heidelberg, 69117, Germany

[4] University of Virginia, Charlottesville, VA 22904, USA

[5] Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität, Jena, 07743, Germany

[6] Helmholtz Institut Jena, Max-Wien-Platz 1, 07743 Jena, Germany

[7] Department of Physics, Texas A&M University, College Station, Texas 77843, USA

Abstract:

Single-shot carrier-envelope phase (CEP) tagging has been combined with a reaction microscope (REMI) to investigate CEP dependent processes in atoms. Unprecedented experimental stability and data acquisition longevity are achieved. Using this new approach, we studied the CEP effects for non-sequential double ionization (NSDI) of argon in 4 fs laser fields at 750 nm and an intensity of 1.6×1014 W/cm**2. The Ar2+ ionization yield shows a pronounced CEP dependence which compares well with recent theoretical predictions employing quantitative rescattering theory [1]. Furthermore, we find strong CEP influences on the Ar2+ momentum spectra along the laser polarization axis.

Status: Physical Review A 83, 013412 (2011).

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